Pouch cell surface inspection
Whereas defects and particles were previously analyzed by random sampling under a microscope to detect particle sizes and defects, an automated process now replaces the time-consuming inspection and classifies the defects and particles. With the trevista DOME solution developed by AIT, objective and qualitative assessments of topographical anomalies can be recognized. High speeds are possible using a line scan camera:
- 150mm/s = particles from 10 µm can be detected
- 500mm/s = particles from 50 µm can be detected
The height images are then analyzed on a PC using AIT EasyPlus and Deep Learning and classified into particles or defects.
